ICE-RADAR: In-situ, Cost-Effective Razor Flip-Flop Deployment for Aging Resilience

Kai-Chiang Wu*, Wei Tao Huang, Chiao Yang Huang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Device aging, which causes significant loss on circuit performance and lifetime, has been a primary factor in reliability degradation of nanoscale designs. In this paper, we propose to exploit timing speculation for aging resilience, based on deploying Razor flip-flops. By formulating the problem based on Boolean satisfiability, we can determine the optimal deployment of Razor flip-flops, such that maximum degree of aging resilience can be achieved in a cost-effective manner. Experimental results show that more than 50% of aging-induced performance degradation can be recovered, while reducing the number of required Razor flip-flops by more than 3X, as compared to the case of naive Razor flip-flop deployment.

Original languageEnglish
Title of host publication2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
EditorsDimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages263-268
Number of pages6
ISBN (Electronic)9781728124902
DOIs
StatePublished - Jul 2019
Event25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 - Rhodes, Greece
Duration: 1 Jul 20193 Jul 2019

Publication series

Name2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

Conference

Conference25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
CountryGreece
CityRhodes
Period1/07/193/07/19

Keywords

  • aging resilience
  • Boolean satisfiability
  • Razor flip-flop

Fingerprint Dive into the research topics of 'ICE-RADAR: In-situ, Cost-Effective Razor Flip-Flop Deployment for Aging Resilience'. Together they form a unique fingerprint.

Cite this