How to analyze technology life cycle from the perspective of patent characteristics?

Pei Chun Lee, Hsin-Ning Su

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations

Abstract

There has been a good deal of studies investigating technology life cycle by measuring patent activity indicators, especially patent applications. As for four main stages of technology life cycle, there is consensus on the interpretation of technology evolution depicted as a S-shaped curve. For measuring market value of a patent, there have been a lot of empirical studies that test patent indicators concerning their appropriability as predictors of monetary patent value. This study aims to observe technology life cycle form the perspective of dynamics of patent characteristics, which are newly proposed as an approach for characterizing technology life cycle in this study. To obtain the objective of this research, DVD technologies which have been already experienced four stages of a life cycle, i.e. 1) Introduction, 2) Growth, 3) Maturity, 4) Decline, is selected for analyzing its patent characteristics as a function of different stages in its life cycle. The results obtained in this study can be served as a basis for creating a model for forecasting the size of potential market in each of the above 4 stages. The larger numbers of patent reference, non-patent references and foreign reference, which occurred in Maturity stage and Decline stage, suggest that mature and declined technology encourages patent inventors to cite prior patents in order to seek for opportunity of radical and discontinuous technological innovation.

Original languageEnglish
Title of host publicationPICMET 2015 - Portland International Center for Management of Engineering and Technology
Subtitle of host publicationManagement of the Technology Age, Proceedings
EditorsTugrul U. Daim, Dilek Cetindamar Kozanoglu, Dundar F. Kocaoglu, Timothy R. Anderson, Gary Perman, Kiyoshi Niwa
PublisherPortland State University
Pages2079-2083
Number of pages5
ISBN (Electronic)9781890843328
DOIs
StatePublished - 21 Sep 2015
EventPortland International Center for Management of Engineering and Technology, PICMET 2015 - Portland, United States
Duration: 2 Aug 20156 Aug 2015

Publication series

NamePortland International Conference on Management of Engineering and Technology
Volume2015-September

Conference

ConferencePortland International Center for Management of Engineering and Technology, PICMET 2015
CountryUnited States
CityPortland
Period2/08/156/08/15

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