@inproceedings{2d31746784154aae92cb962ce7b217ed,
title = "Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope",
abstract = "For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.",
author = "Zhuo, {Guan Yu} and Zu-Po Yang and Ming-Che Chan",
year = "2018",
month = aug,
day = "6",
doi = "10.1364/CLEO_AT.2018.JTu2A.93",
language = "English",
isbn = "9781943580422",
series = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",
address = "United States",
note = "null ; Conference date: 13-05-2018 Through 18-05-2018",
}