Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope

Guan Yu Zhuo; Zu-Po Yang; Ming-Che Chan

doi:10.1364/CLEO_AT.2018.JTu2A.93

Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope

Guan Yu Zhuo, Zu-Po Yang, Ming-Che Chan

Institute of Photonic System

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.

Original language	English
Title of host publication	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781943580422
DOIs	https://doi.org/10.1364/CLEO_AT.2018.JTu2A.93
State	Published - 6 Aug 2018
Event	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States Duration: 13 May 2018 → 18 May 2018

Publication series

Name	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Conference

Conference	2018 Conference on Lasers and Electro-Optics, CLEO 2018
Country	United States
City	San Jose
Period	13/05/18 → 18/05/18

Access to Document

10.1364/CLEO_AT.2018.JTu2A.93

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Zhuo, G. Y., Yang, Z-P., & Chan, M-C. (2018). Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings [8427176] (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1364/CLEO_AT.2018.JTu2A.93

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title = "Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope",

abstract = "For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.",

author = "Zhuo, {Guan Yu} and Zu-Po Yang and Ming-Che Chan",

year = "2018",

month = aug,

day = "6",

doi = "10.1364/CLEO_AT.2018.JTu2A.93",

language = "English",

isbn = "9781943580422",

series = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

address = "United States",

note = "null ; Conference date: 13-05-2018 Through 18-05-2018",

}

Zhuo, GY, Yang, Z-P & Chan, M-C 2018, Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope. in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8427176, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 13/05/18. https://doi.org/10.1364/CLEO_AT.2018.JTu2A.93

Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope. / Zhuo, Guan Yu; Yang, Zu-Po ; Chan, Ming-Che.

2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. 8427176 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope

AU - Zhuo, Guan Yu

AU - Yang, Zu-Po

AU - Chan, Ming-Che

PY - 2018/8/6

Y1 - 2018/8/6

N2 - For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.

AB - For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.

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U2 - 10.1364/CLEO_AT.2018.JTu2A.93

DO - 10.1364/CLEO_AT.2018.JTu2A.93

M3 - Conference contribution

AN - SCOPUS:85052600359

SN - 9781943580422

T3 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

BT - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 13 May 2018 through 18 May 2018

ER -

Zhuo GY, Yang Z-P , Chan M-C. Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. 8427176. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings). https://doi.org/10.1364/CLEO_AT.2018.JTu2A.93