Hotspot detection in integrated circuits by two-photon-fluorescence-based thermal microscope

Guan Yu Zhuo, Zu-Po Yang, Ming-Che Chan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.

Original languageEnglish
Title of host publication2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781943580422
DOIs
StatePublished - 6 Aug 2018
Event2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States
Duration: 13 May 201818 May 2018

Publication series

Name2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Conference

Conference2018 Conference on Lasers and Electro-Optics, CLEO 2018
CountryUnited States
CitySan Jose
Period13/05/1818/05/18

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