HOT-ELECTRON EFFECTS IN MOSFET'S.

Chen-Ming Hu*

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

72 Scopus citations
Original languageEnglish
Pages (from-to)176-181
Number of pages6
JournalTechnical Digest - International Electron Devices Meeting
DOIs
StatePublished - 1 Dec 1983

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