Hole Transport Manipulation to Improve the Hole Injection for Deep Ultraviolet Light-Emitting Diodes

Zi Hui Zhang, Sung Wen Huang Chen, Yonghui Zhang, Luping Li, Sheng Wen Wang, Kangkai Tian, Chunshuang Chu, Mengqian Fang, Hao-Chung Kuo*, Wengang Bi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

45 Scopus citations

Abstract

In this report, we propose to enhance the hole injection efficiency by adjusting the barrier height of the p-type electron blocking layer (p-EBL) for ∼273 nm deep ultraviolet light-emitting diodes (DUV LEDs). The barrier height for the p-EBL is modified by employing a p-Al0.60Ga0.40N/Al0.50Ga0.50N/p-Al0.60Ga0.40N structure, in which the very thin Al0.50Ga0.50N layer is able to achieve a high local hole concentration, which is very effective in reducing the effective barrier height of the p-EBL for holes. More importantly, besides the thermionic emission, such a p-EBL structure can also favor a strong intraband tunneling process for holes. As a result, we can obtain a more efficient hole injection into the quantum wells, leading to a remarkably improved optical power for the DUV LED with the proposed p-EBL architecture.

Original languageEnglish
Pages (from-to)1846-1850
Number of pages5
JournalACS Photonics
Volume4
Issue number7
DOIs
StatePublished - 19 Jul 2017

Keywords

  • carrier transport
  • deep ultraviolet LED
  • hole injection
  • p-EBL

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