Highly reliable integrated amorphous silicon thin film transistors gate driver

Chin Wei Liu*, Ya-Hsiang Tai

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A reliable shift register consisted of amorphous silicon thin film transistors (a-Si TFTs) is proposed for scan driver circuit of active matrix liquid crystal display (AMLCD). The lifetime of proposed circuit is evaluated based on the reliability measurement data of the a-Si TFTs used and it is estimated to over 5000 hours. Therefore, a highly reliable scanning circuit can be achieved.

Original languageEnglish
Title of host publicationIDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings
Pages519-522
Number of pages4
StatePublished - 1 Dec 2007
EventInternational Display Manufacturing Conference and Exhibition, IDMC 2007 - Taipei, Taiwan
Duration: 3 Jul 20076 Jul 2007

Publication series

NameIDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings

Conference

ConferenceInternational Display Manufacturing Conference and Exhibition, IDMC 2007
CountryTaiwan
CityTaipei
Period3/07/076/07/07

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  • Cite this

    Liu, C. W., & Tai, Y-H. (2007). Highly reliable integrated amorphous silicon thin film transistors gate driver. In IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings (pp. 519-522). (IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings).