Highly reliable GaN-based light-emitting diodes formed by p-In0.1Ga0.9N-ITO structure

Kow-Ming Chang*, Jiunn Yi Chu, Chao Chen Cheng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

23 Scopus citations


Indium-tin-oxide (ITO) is deposited as a transparent current spreading layer of GaN-based light-emitting diodes (LEDs). To reduce the interfacial Schottky barrier height, a thin p - In0.1Ga0.9N layer is grown as an intermediate between ITO and p-GaN. The contact resistivity around 2.6 × 10-2 Ω · cm2 results in a moderately high forward voltage LED of 3.43 V operated at 20 mA. However, the external quantum efficiency and power efficiency are enhanced by 46% and 36%, respectively, in comparison with the conventional Ni-Au contact LEDs. In the life test, the power degradation of the p-In0.1Ga0.9N-ITO contact samples also exhibits a lower value than that of the conventional ones.

Original languageEnglish
Pages (from-to)1807-1809
Number of pages3
JournalIEEE Photonics Technology Letters
Issue number8
StatePublished - 1 Aug 2004

Fingerprint Dive into the research topics of 'Highly reliable GaN-based light-emitting diodes formed by p-In0.1Ga0.9N-ITO structure'. Together they form a unique fingerprint.

Cite this