High speed piezo force microscopy: Nanoscale and nanosecond direct observations of domain switching

R. Nath*, N. Polomoff, J. Bosse, Ying-hao Chu, R. Ramesh, B. D. Huey

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

High Speed Piezo Force Microscopy (HSPFM) is a new variation of Atomic Force Miroscopy (AFM) for direct nanoscale measurements of domain switching dynamics. Image acquisition is accelerated from several minutes for standard piezo force microscopy to as fast as a fraction of a second for HSPFM. Movies of consecutive images during in-situ domain switching therefore allow high spatial and temporal resolution, with less than 500 nanosecond poling per pixel achieved. The influence of individual defects on domain nucleation, growth mechanisms, switching speed, and switching energy are therefore uniquely apparent.

Original languageEnglish
Title of host publication17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
DOIs
StatePublished - 1 Dec 2008
Event17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 - Santa Fe, NM, United States
Duration: 23 Feb 200828 Feb 2008

Publication series

NameIEEE International Symposium on Applications of Ferroelectrics
Volume1

Conference

Conference17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
CountryUnited States
CitySanta Fe, NM
Period23/02/0828/02/08

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