High-sensitivity optically modulated scatterer for electromagnetic-field measurement

Ray Rong Lao*, Wen Lie Liang, Wen Tron Shay, Richard P. Thompson, Richard A. Dudley, Olivier Merckel, Nicolas Ribière-Tharaud, Jean Charles Bolomey, Jenn-Hawn Tarng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

The optically modulated-scatterer (OMS) technique is developed for electromagnetic-field-distribution measurement with minimum disturbance to the field under test. In this paper, an OMS with newly designed photoconductive-switching structure is proposed. The performances of the new OMS are evaluated with a monostatic-field-measurement system. Measurement results show that an improvement of 6 to 8 dB in sensitivity is achieved compared to previous OMS devices. The developed OMS was used in an electromagnetic-field-distribution mapping system to measure the field distribution in a cubic phantom radiated by a mobile phone. The results show the suitability of this OMS for specific-absorption-rate measurement application.

Original languageEnglish
Pages (from-to)486-490
Number of pages5
JournalIEEE Transactions on Instrumentation and Measurement
Volume56
Issue number2
DOIs
StatePublished - 1 Apr 2007

Keywords

  • Optically modulated scatterer (OMS)
  • Radiated field
  • Specific absorption rate (SAR)

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