High-performance bottom-gate poly-si polysilicon-oxide-nitride-oxide- silicon thin film transistors crystallized by excimer laser irradiation for two-bit nonvolatile memory applications

I. Che Lee*, Hsu Hang Kuo, Chun Chien Tsai, Chao Lung Wang, Po Yu Yang, Jyh Liang Wang, Huang-Chung Cheng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

High-performance bottom-gate (BG) poly-Si polysilicon-oxide-nitride-oxide- silicon (SONOS) TFTs with single grain boundary perpendicular to the channel direction have been demonstrated via simple excimer-laser-crystallization (ELC) method. Under an appropriate laser irradiation energy density, the silicon grain growth started from the thicker sidewalls intrinsically caused by the bottom-gate structure and impinged in the center of the channel. Therefore, the proposed ELC BG SONOS TFTs exhibited superior transistor characteristics than the conventional solid-phase-crystallized ones, such as higher ?eld effect mobility of 393 cm 2 /V-s and steeper subthreshold swing of 0.296 V/dec. Due to the high ?eld effect mobility, the electron velocity, impact ionization, and conduction current density could be enhanced effectively, thus improving the memory performance. Based on this mobility-enhanced scheme, the proposed ELC BG SONOS TFTs exhibited better performance in terms of relatively large memory window, high program/erase speed, long retention time, and 2-bit operation. Such an ELC BG SONOS TFT with single-grain boundary in the channel is compatible with the conventional a-Si TFT process and therefore very promising for the embedded memory in the system-on-panel applications.

Original languageEnglish
Pages (from-to)5318-5324
Number of pages7
JournalJournal of Nanoscience and Nanotechnology
Volume12
Issue number7
DOIs
StatePublished - 1 Jul 2012

Keywords

  • Bottom-Gate (BG)
  • Excimer Laser Crystallization (ELC)
  • Nonvolatile Memory (NVM)
  • SONOS
  • Thin Film Transistor (TFT)

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