Ground states of shallow donor impurities on anisotropic semiconductor surfaces

W. J. Huang*, Wu-Ching Chou, D. S. Chuu, C. S. Han, W. N. Mei

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

The surface impurity ground states of anisotropic semiconductors are studied by two different methods, namely the perturbative variational method and the principle of minimal sensitivity which were developed recently. The treatment is based on (i) a parabolic one-band model and (ii) an infinite-barrier model for electronic states. In spite of the simplicity of the methods, it is found that the calculated energies for Ge and Si are very close to the results obtained by the conventional variational method. The validity of the variational trial wavefunction used in previous calculations is also discussed. A new variational trial function is also proposed for the case of the anisotropic crystals.

Original languageEnglish
Article number007
Pages (from-to)202-207
Number of pages6
JournalSemiconductor Science and Technology
Volume3
Issue number3
DOIs
StatePublished - 1 Dec 1988

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