Two surface/interface sensitive scattering techniques are featured in this article; they are the grazing incidence x-ray scattering (GIXS) and the crystal truncation rod (CTR) measurements. Both techniques require the use of high brilliance synchrotron radiation in order to ensure good resolution and high statistical accuracy. After a brief introduction of the specific techniques in question, a few selected examples of particular interest to the author are presented to illustrate the power of the techniques when applied to studies of buried interface structure.
|Number of pages||6|
|Journal||Anales des la Asociacion Quimica Argentina|
|State||Published - 1 Dec 1996|