Gm-C filter with automatic calibration scheme

Hong Yi Huang, Kun Yuan Chen, Jia Hao Xie, Ming Ta Lee, Hao-Chiao Hong, Kuo Hsing Cheng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This work presents a fifth-order OTA-C band-pass filter applying Elliptic low-pass filter and complex filter techniques. The frequency error of the filter due to the effect of process variations is induced by integrating the passive components with the operational transconductance amplifier on chip. A filter circuit with automatic calibration scheme can make the frequency less dependent on process, voltage, and temperature variations. The layout of a test chip is realized using a 0.18 um 1P6M CMOS process. Post-layout simulation demonstrates that the center frequency of the band pass filter is 450 kHz and the dynamic range is 35 dB, It has a total power consumption of 0.14mW.

Original languageEnglish
Title of host publicationFormal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509024674
DOIs
StatePublished - 31 May 2016
Event19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016 - Kosice, Slovakia
Duration: 20 Apr 201622 Apr 2016

Publication series

NameFormal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016

Conference

Conference19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016
CountrySlovakia
CityKosice
Period20/04/1622/04/16

Keywords

  • Automatic calibration scheme
  • band-pass filter
  • complex filter
  • Fifth-order elliptic filter
  • OTA-C low-pass filter

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    Huang, H. Y., Chen, K. Y., Xie, J. H., Lee, M. T., Hong, H-C., & Cheng, K. H. (2016). Gm-C filter with automatic calibration scheme. In Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016 [7482471] (Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DDECS.2016.7482471