Generalized interconnect delay time and crosstalk models: II. Crosstalk-induced delay time deterioration and worst crosstalk models

Trent Gwo Yann Lee*, Tseung-Yuen Tseng, Shyh Chyi Wong, Cheng Jer Yang, Mong Song Liang, Huang-Chung Cheng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

New analytical models for estimating crosstalk-induced delay time deterioration and the worst crosstalk models of a coupled interconnect for ramp input waveform are derived. The accuracy of these compact models at various driver resistances, loading capacitances, and input-ramping rates is verified by simulation program with integrated circuit emphasis (SPICE) simulation for the parallel interconnect system. The effects of crosstalk noise on the delay time at various ramp input rise times, for both simultaneous and non-simultaneous switching cases, are discussed here. In this study we show that crosstalk noise will be a limiting factor for future fast transition signals. The results reported herein are useful in the studies of delay time uncertainties due to noise and the interconnect worst-case design.

Original languageEnglish
Pages (from-to)6694-6699
Number of pages6
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume40
Issue number12R
DOIs
StatePublished - 1 Dec 2001

Keywords

  • Closed-form model
  • Crosstalk
  • Crosstalk-enhanced delay
  • Delay
  • Interconnect
  • Model
  • Optimization
  • Worst case

Fingerprint Dive into the research topics of 'Generalized interconnect delay time and crosstalk models: II. Crosstalk-induced delay time deterioration and worst crosstalk models'. Together they form a unique fingerprint.

Cite this