Future of integrated devices

Hiroshi Iwai*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Progress of ICT (Information and Communication Technology) made our society 'smart' and convenient. Already, internet, SNS, smart phones, IoT, and big data analysis are available. In near future full-automatic automobile drive will become possible, and even some people expected that the artificial intelligence will exceed the human brain ability 30 years from now. In anyhow our society will be revolutionarily changed within a few decades by ICT progress. The progress of the ICT has been driven by the development of integrated technologies. It was 1971 when the first microprocessor by Intel realized the ICT with small-size and low power consumption. The performance of the microprocessor at that time was, however, only a millionth of today's one. In order to improve the performance, huge efforts have been made to miniaturize the MOSFETs. Indeed, the miniaturization has been conducted for 19 generations from 10 μm to 14 nm technologies, according to the guide line of Moore's law and the scaling theory. However, the former is just a prediction of the growth rate of the numbers of the components or MOSFETs in a chip, and the latter is a principle of the downscaling scheme of the MOSFETs. They are not to guarantee the actual miniaturization nor to show concrete solutions to make the miniaturization successful. Thus, innovations, such as novel ideas, the improvement of the structures, or the introduction of new process techniques and new materials have been requited for every miniaturized generations.

Original languageEnglish
Title of host publication15th International Workshop on Junction Technology, IWJT 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages43
Number of pages1
ISBN (Electronic)9784863485174
DOIs
StatePublished - 9 May 2016
Event15th International Workshop on Junction Technology, IWJT 2015 - Kyoto, Japan
Duration: 11 Jun 201512 Jun 2015

Publication series

Name15th International Workshop on Junction Technology, IWJT 2015

Conference

Conference15th International Workshop on Junction Technology, IWJT 2015
CountryJapan
CityKyoto
Period11/06/1512/06/15

Fingerprint Dive into the research topics of 'Future of integrated devices'. Together they form a unique fingerprint.

Cite this