Fundamentals of Electromigration

King Ning Tu*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapter

10 Scopus citations

Abstract

An ordinary household extension cord conducts electricity without electromigration in the cord because the electric current density in the cord is low, about 102 A/cm2, and also the ambient temperature is too low for atomic diffusion to occur in copper.

Original languageEnglish
Title of host publicationSpringer Series in Materials Science
PublisherSpringer Verlag
Pages211-243
Number of pages33
DOIs
StatePublished - 1 Jan 2007

Publication series

NameSpringer Series in Materials Science
Volume117
ISSN (Print)0933-033X
ISSN (Electronic)2196-2812

Keywords

  • Back Stress
  • Critical Length
  • Solder Bump
  • Solder Joint
  • Void Formation

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  • Cite this

    Tu, K. N. (2007). Fundamentals of Electromigration. In Springer Series in Materials Science (pp. 211-243). (Springer Series in Materials Science; Vol. 117). Springer Verlag. https://doi.org/10.1007/978-0-387-38892-2_8