Framing patent indicators for innovation study

Peng I. Lee, Hsin-Ning Su

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Patent indicators are increasingly used to assess competitive advantage or technology development trends for innovation studies. There are a number of patent indicators proposed in the literature to access such technology-based innovativeness. However, most of the studies arbitrarily select patent indicators for their investigations without optimizing the choice of indicators. Only a limited researchers attempt to classify patent indicators to assist the selection of indicators for diverse research objectives. In this paper, a novel framework structure is provided to frame patent indicators accepted in scientific literature after extensive review on patent related journal papers. The framework provides insights on comprehensive correlations as well as management implications of obtainable patent indicators. It is expected that this framework can be served as a channel for innovation studies to uncover much wider and systematic insights from the application of patent indicators.

Original languageEnglish
Title of host publicationPICMET 2016 - Portland International Conference on Management of Engineering and Technology
Subtitle of host publicationTechnology Management For Social Innovation, Proceedings
EditorsTimothy R. Anderson, Dundar F. Kocaoglu, Kiyoshi Niwa, Gary Perman, Dilek Cetindamar Kozanoglu, Tugrul U. Daim
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1021-1030
Number of pages10
ISBN (Electronic)9781509035953
DOIs
StatePublished - 4 Jan 2017
Event2016 Portland International Conference on Management of Engineering and Technology, PICMET 2016 - Honolulu, United States
Duration: 4 Sep 20168 Sep 2016

Publication series

NamePICMET 2016 - Portland International Conference on Management of Engineering and Technology: Technology Management For Social Innovation, Proceedings

Conference

Conference2016 Portland International Conference on Management of Engineering and Technology, PICMET 2016
CountryUnited States
CityHonolulu
Period4/09/168/09/16

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  • Cite this

    Lee, P. I., & Su, H-N. (2017). Framing patent indicators for innovation study. In T. R. Anderson, D. F. Kocaoglu, K. Niwa, G. Perman, D. C. Kozanoglu, & T. U. Daim (Eds.), PICMET 2016 - Portland International Conference on Management of Engineering and Technology: Technology Management For Social Innovation, Proceedings (pp. 1021-1030). [7806676] (PICMET 2016 - Portland International Conference on Management of Engineering and Technology: Technology Management For Social Innovation, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PICMET.2016.7806676