Flicker noise characteristics of advanced MOS technologies

K. K. Hung*, P. K. Ko, Chen-Ming Hu, Y. C. Cheng

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

22 Scopus citations

Fingerprint Dive into the research topics of 'Flicker noise characteristics of advanced MOS technologies'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy