Flaw inspection and detection for small-pixel TFT-Array

Y. C. Wang, Bor-Shyh Lin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


The display pixels and resolution on array process are getting smaller and higher precision, for advanced small-pixel and high-resolution display applications. The paper proposed the characteristics of flaw detection in small-pixel design displays based on TFT liquid crystal displays with respect to electrical-physic characterization metrics. Observer studies resulted in small-sized pixel TFT array between the flaw detection performance and maker preference approaches. Detection performance factors provided information on the differences among small-pixel design for advanced display technologies .It also shown that critical pixel defect played an important role than previously seen in non-small pixel TFT array panels for managing process yield. The method of voltage imaging for detection, developed in this study provides an initial insight into the small-sized pixel designs for advanced and precision to diagnostic images in display devices.

Original languageEnglish
Title of host publication20th International Display Workshops 2013, IDW 2013
PublisherInternational Display Workshops
Number of pages2
ISBN (Electronic)9781510827783
StatePublished - 1 Jan 2013
Event20th International Display Workshops 2013, IDW 2013 - Sapporo, Japan
Duration: 3 Dec 20136 Dec 2013

Publication series

NameProceedings of the International Display Workshops
ISSN (Print)1883-2490


Conference20th International Display Workshops 2013, IDW 2013


  • Flaw detection
  • Flaw inspection
  • Small-pixel
  • TFT-Array

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