Flaw inspection and detection for small-pixel TFT-Array

Y. C. Wang, Bor-Shyh Lin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The display pixels and resolution on array process are getting smaller and higher precision, for advanced small-pixel and high-resolution display applications. The paper proposed the characteristics of flaw detection in small-pixel design displays based on TFT liquid crystal displays with respect to electrical-physic characterization metrics. Observer studies resulted in small-sized pixel TFT array between the flaw detection performance and maker preference approaches. Detection performance factors provided information on the differences among small-pixel design for advanced display technologies .It also shown that critical pixel defect played an important role than previously seen in non-small pixel TFT array panels for managing process yield. The method of voltage imaging for detection, developed in this study provides an initial insight into the small-sized pixel designs for advanced and precision to diagnostic images in display devices.

Original languageEnglish
Title of host publication20th International Display Workshops 2013, IDW 2013
PublisherInternational Display Workshops
Pages651-652
Number of pages2
ISBN (Electronic)9781510827783
StatePublished - 1 Jan 2013
Event20th International Display Workshops 2013, IDW 2013 - Sapporo, Japan
Duration: 3 Dec 20136 Dec 2013

Publication series

NameProceedings of the International Display Workshops
Volume1
ISSN (Print)1883-2490

Conference

Conference20th International Display Workshops 2013, IDW 2013
CountryJapan
CitySapporo
Period3/12/136/12/13

Keywords

  • Flaw detection
  • Flaw inspection
  • Small-pixel
  • TFT-Array

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