Flaw detection and measurement for 4K Ultra HD thin-film-transistor array panel

Yao Chin Wang*, Bor-Shyh Lin, Kei Hsiung Yang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Display pixels of liquid-crystal-display televisions (LCD TVs) on thin-film-transistor (TFT) array are getting smaller. This paper introduced the method of voltage imaging technique, which developed and provides initial insight into the thin-film-transistor array flaw detection and measurement for ultra-high-definition (Ultra HD, UHD) LCD TV application. We proposed the measurement of flaw detection, based on TFT array testing and characterization with respect to opto-electric transformation measurement.

Original languageEnglish
Pages (from-to)236-240
Number of pages5
JournalMeasurement: Journal of the International Measurement Confederation
Volume51
Issue number1
DOIs
StatePublished - 1 Jan 2014

Keywords

  • 4K Ultra HD
  • Flaw detection
  • Measurement
  • TFT array panel

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