Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications

Huang Ming Lee, Kartika Chandra Sahoo, Yiming Li, Jong Ching Wu*, Edward Yi Chang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

We numerically calculate the spectral reflectivity of the silicon nitride (Si3N4) sub-wavelength structure (SWS) using a two-dimensional finite element simulation. The geometry-dependent effective reflectance of the Si3N4 SWS over the wavelength ranging from 400 nm to 1000 nm is examined and the structure of Si3N 4 SWS is further optimized for the lowest effective reflectance. A p-n junction solar cell efficiency based on the optimized Si3N 4 SWS is also calculated, resulting in an improvement of 0.98% in efficiency than that of single layer antireflection coatings.

Original languageEnglish
Pages (from-to)7204-7208
Number of pages5
JournalThin Solid Films
Volume518
Issue number24
DOIs
StatePublished - 1 Oct 2010

Keywords

  • Antireflection coating
  • Finite element simulation
  • Silicon nitride
  • Solar cell
  • Sub-wavelength structure

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