Femtosecond laser ablation dynamics of an amorphous thin film of a substituted Cu-phthalocyanine was studied using time-resolved absorption spectroscopic and scattering imaging methods. Above the ablation threshold of 45 mJ/cm2, the etch-depth is about 400 nm and almost constant up to a laser fluence of 300 mJ/cm2. Transient absorption spectra confirmed that the electronic excitation energy is converted to heat through exciton-exciton annihilation within 100 ps after excitation. The etching profile and ablation threshold are discussed in connection with the heating rate.
|Number of pages||4|
|Journal||Applied Surface Science|
|State||Published - 1 Feb 2000|
|Event||The Symposium A on Photo-Excited Processes, Diagnostics and Applications of the 1999 E-MRS Spring Conference (ICPEPA-3) - Strasbourg, France|
Duration: 1 Jun 1999 → 4 Jun 1999