Fault dictionary size reduction for million-gate large circuits

Yu R. Hong*, Juinn-Dar Huang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today's million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.

Original languageEnglish
Title of host publicationProceedings of the ASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007
Pages829-834
Number of pages6
DOIs
StatePublished - 1 Dec 2007
EventASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007 - Yokohama, Japan
Duration: 23 Jan 200727 Jan 2007

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

ConferenceASP-DAC 2007 - Asia and South Pacific Design Automation Conference 2007
CountryJapan
CityYokohama
Period23/01/0727/01/07

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