Fault diagnosis of a distributed knockout switch

Y. J. Cheng*, Tsern-Huei Lee, W. Z. Shen

*Corresponding author for this work

Research output: Contribution to journalArticle


The distributed knockout switch has multiple paths between any input and output pair and thus is inherently robust to faults without the need of adding any additional switch elements. However, to achieve fault tolerance, one has to first detect and locate the faults. The authors present an efficient fault diagnosis procedure to detect, locate, and identify the fault type of single switch element faults for the switch element array of the distributed knockout switch. To facilitate fault diagnosis, the operation of switch elements is slightly modified. The diagnosis procedure can locate most single switch element faults in two phases. Faults which cannot be located in two phases can always be located in a third phase. Binary search algorithms are developed to locate some kinds of single switch element faults in the third phase.

Original languageEnglish
Pages (from-to)241-248
Number of pages8
JournalIEE Proceedings: Communications
Issue number4
StatePublished - 1 Jan 1998


  • Distributed knockout switch
  • Fault diagnosis procedure
  • Snitch element array

Fingerprint Dive into the research topics of 'Fault diagnosis of a distributed knockout switch'. Together they form a unique fingerprint.

  • Cite this