Extracting a simplified view of design functionality via vector simulation

Onur Guzey*, Charles Wen, Li C. Wang, Tao Feng, Magdy S. Abadir

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper presents a simulation-based methodology for extracting a simplified view of a design's input-output behavior. Such a simplified design view can be used to facilitate test pattern justification from the outputs of the module to the inputs of the module. In this work, extraction of a design simplification view is formulated as a learning problem. With a learning scheme for learning word-level functions, the core of the problem becomes developing an efficient Boolean learner. We discuss the implementation of such a Boolean learner and compare its performance with the one of best-known Boolean learning algorithms, the Fourier analysis based method. Experimental results are presented to illustrate the implementation of the simulation-based methodology and its usage for extracting a simplified functionality view from Open RISC 1200 datapath.

Original languageEnglish
Title of host publicationProceedings - 11th Annual IEEE International High-Level Design Validation and Test Workshop, HLDVT'06
Pages195-202
Number of pages8
DOIs
StatePublished - 1 Dec 2006
Event11th Annual IEEE International High-Level Design Validation and Test Workshop, HLDVT'06 - Monterey, CA, United States
Duration: 8 Nov 200610 Nov 2006

Publication series

NameProceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT
ISSN (Print)1552-6674

Conference

Conference11th Annual IEEE International High-Level Design Validation and Test Workshop, HLDVT'06
CountryUnited States
CityMonterey, CA
Period8/11/0610/11/06

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  • Cite this

    Guzey, O., Wen, C., Wang, L. C., Feng, T., & Abadir, M. S. (2006). Extracting a simplified view of design functionality via vector simulation. In Proceedings - 11th Annual IEEE International High-Level Design Validation and Test Workshop, HLDVT'06 (pp. 195-202). [4110090] (Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT). https://doi.org/10.1109/HLDVT.2006.319991