Experimental evidence for the morphology of the antifuse

Steve Chiang*, Roger Wang, Jacob Chen, Ken Hayes, John McCollum, Esmat Hamdy, Chen-Ming Hu

*Corresponding author for this work

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

Elsewhere models have been proposed for the operation of the antifuse that is used as the programming element in Field Programmable Gate Arrays (FPGAs). We present new and previously unpublished experimental results, including the first micrographs of the conducting link, evidence on which any speculation regarding operating mechanisms must be based.

Original languageEnglish
Pages (from-to)45-46, 48
JournalElectronic Engineering (London)
Volume63
Issue number774
StatePublished - 1 Jun 1991

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    Chiang, S., Wang, R., Chen, J., Hayes, K., McCollum, J., Hamdy, E., & Hu, C-M. (1991). Experimental evidence for the morphology of the antifuse. Electronic Engineering (London), 63(774), 45-46, 48.