Evidence of two-length-scale kinetics of R-phase transformation by high-energy X-ray diffraction

Y. D. Wang*, Y. Ren, E-Wen Huang, G. Wang, Z. H. Nie, L. Zuo, P. K. Liaw

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The cubic-to-rhombohedral (C-R) phase transition in an AuCd shape memory alloy was investigated by in situ high-energy X-ray diffraction. We present the first direct experimental evidence of two-length-scale phase transition kinetics in this alloy system. It was further found that aging in the R-phase leads to two-way memory "loss", characterized by the reselection of new variants. We attributed this two-way memory "loss" to the internal stresses caused by the defects formed in the off-equilibrium state of the studied AuCd system.

Original languageEnglish
Pages (from-to)617-620
Number of pages4
JournalScripta Materialia
Volume62
Issue number8
DOIs
StatePublished - 1 Apr 2010

Keywords

  • Martensitic phase transformation
  • Phase transformation kinetics
  • R-phase
  • Shape memory alloy
  • X-ray diffraction (XRD)

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