Evaluation on efficient measurement setup for transient-induced latchup with BI-polar trigger

Ming-Dou Ker*, Sheng Fu Hsu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

11 Scopus citations

Abstract

An efficient measurement setup for transient-induced latchup (TLU) with bi-polar trigger is evaluated in this paper. The influences of the current-blocking diode and the current-limiting resistance on TLU immunity are investigated with the silicon controlled rectifier (SCR) fabricated in a 0.25-μm CMOS technology. The measurement setup without a current-blocking diode but with a small current-limiting resistance is recommended to evaluate TLU immunity of CMOS ICs. This recommended measurement setup not only can accurately judge the TLU level of CMOS ICs without over estimation, but also is beneficial to avoid electrical over-stress (EOS) damage on device under test (DUT). To further prove the utility of this recommended TLU measurement in the real circuits, a ring oscillator fabricated by 0.25-μm CMOS technology is used as the test circuit for verification.

Original languageEnglish
Title of host publication2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual
Pages121-128
Number of pages8
DOIs
StatePublished - 15 Dec 2005
Event2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual - San Jose, CA, United States
Duration: 17 Apr 200521 Apr 2005

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Conference

Conference2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual
CountryUnited States
CitySan Jose, CA
Period17/04/0521/04/05

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