Evaluation of the Role of Deep Trap State Using Analytical Model in the Program/Erase Cycling of NAND Flash Memory and Its Process Dependence

Bo Jun Yang, Yu Ting Wu, Yung Yueh Chiu, Tse Mien Kuo, Jung Ho Chang, Pin Yao Wang, Shirota Riichiro*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

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Chemical Compounds

Engineering & Materials Science