Evaluation of the Role of Deep Trap State Using Analytical Model in the Program/Erase Cycling of NAND Flash Memory and Its Process Dependence

Bo Jun Yang, Yu Ting Wu, Yung Yueh Chiu, Tse Mien Kuo, Jung Ho Chang, Pin Yao Wang, Shirota Riichiro*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Fingerprint Dive into the research topics of 'Evaluation of the Role of Deep Trap State Using Analytical Model in the Program/Erase Cycling of NAND Flash Memory and Its Process Dependence'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science