Evaluation of the operation for the shift register circuit implemented by low temperature poly-Si thin-film transistors

Hung Guang Liou*, Ya-Hsiang Tai

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, the LTPS TFT shift register circuit is simulated with Monte Carlo method to evaluate the effects due to the non-uniformity in the LTPS TFT characteristics. A computationally efficient method has been presented for the estimation of the power distribution and the yield in the presence of device variations.

Original languageEnglish
Title of host publicationProceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05
EditorsH.P. David Shieh, F.C. Chen
Pages453-455
Number of pages3
StatePublished - 1 Dec 2005
EventInternational Display Manufacturing Conference and Exhibition, IDMC'05 - Taipei, Japan
Duration: 21 Feb 200524 Feb 2005

Publication series

NameInternational Display Manufacturing Conference and Exhibition, IDMC'05

Conference

ConferenceInternational Display Manufacturing Conference and Exhibition, IDMC'05
CountryJapan
CityTaipei
Period21/02/0524/02/05

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