Evaluation of the BSIM6 compact MOSFET model's scalability in 40nm CMOS technology

M. A. Chalkiadaki*, A. Mangia, C. C. Enz, Y. S. Chauhan, M. A. Karim, S. Venugopalan, A. Niknejad, Chen-Ming Hu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

The aggressive downscaling of advanced bulk CMOS technologies demands MOSFET models that are able to describe accurately the behavior of devices accounting for all the physical phenomena. A reliable model should have the ability to handle all the different operating regions of the MOS transistor in the whole geometry range of one technology. Targeting to meet the aforementioned needs, the new charge-based compact model BSIM6 has been developed. In this article, as a first benchmarking of BSIM6, the model is evaluated for its scaling capabilities when a single set of parameters is used. The model is compared against a state-of-the-art 40nm CMOS technology. The results attest the model's scalability under all bias conditions, proving its reliability for nowadays complex IC designs.

Original languageEnglish
Title of host publication2012 Proceedings of the European Solid-State Device Research Conference, ESSDERC 2012
Pages50-53
Number of pages4
DOIs
StatePublished - 11 Dec 2012
Event42nd European Solid-State Device Research Conference, ESSDERC 2012 - Bordeaux, France
Duration: 17 Sep 201221 Sep 2012

Publication series

NameEuropean Solid-State Device Research Conference
ISSN (Print)1930-8876

Conference

Conference42nd European Solid-State Device Research Conference, ESSDERC 2012
CountryFrance
CityBordeaux
Period17/09/1221/09/12

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    Chalkiadaki, M. A., Mangia, A., Enz, C. C., Chauhan, Y. S., Karim, M. A., Venugopalan, S., Niknejad, A., & Hu, C-M. (2012). Evaluation of the BSIM6 compact MOSFET model's scalability in 40nm CMOS technology. In 2012 Proceedings of the European Solid-State Device Research Conference, ESSDERC 2012 (pp. 50-53). [6343331] (European Solid-State Device Research Conference). https://doi.org/10.1109/ESSDERC.2012.6343331