Evaluating and enhancing the long-term competitiveness of a semiconductor product

Yu Cheng Lin, Tin-Chih Chen*, Kun Tai Li

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Yield is undoubtedly the most critical factor to the competitiveness of a product in a semiconductor manufacturing factory. Therefore, evaluating the competitiveness of a product with its yield is a reasonable idea. For this purpose, Chen's approach is extended in this study to evaluate the long-term competitiveness of a product through yield learning modeling in various ways. Subsequently, to enhance the long-term competitiveness of the product, capacity re-allocation is shown to be helpful. The effects are modeled. Finally, a fuzzy nonlinear programming (FNP) model is constructed to optimize the performance. A practical example is used to demonstrate the proposed methodology.

Original languageEnglish
Title of host publicationNext-Generation Applied Intelligence - 22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Proceedings
Pages242-251
Number of pages10
DOIs
StatePublished - 9 Nov 2009
Event22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009 - Tainan, Taiwan
Duration: 24 Jun 200927 Jun 2009

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume5579 LNAI
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009
CountryTaiwan
CityTainan
Period24/06/0927/06/09

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    Lin, Y. C., Chen, T-C., & Li, K. T. (2009). Evaluating and enhancing the long-term competitiveness of a semiconductor product. In Next-Generation Applied Intelligence - 22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Proceedings (pp. 242-251). (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 5579 LNAI). https://doi.org/10.1007/978-3-642-02568-6_25