Estimation of the Gilbert model parameters using the simulated annealing method

T. H. Tan; Wen-Whei Chang

doi:10.1049/el:19960840

Estimation of the Gilbert model parameters using the simulated annealing method

T. H. Tan^*, Wen-Whei Chang

^*Corresponding author for this work

National Chiao Tung University

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

An estimation method based on the simulated annealing algorithm is proposed for computing the Gilbert model parameters from sample error sequences. Experimental results indicate that the simulated annealing method yields estimates which more closely match the experimental error statistics.

Original language	English
Pages (from-to)	1256-1258
Number of pages	3
Journal	Electronics Letters
Volume	32
Issue number	14
DOIs	https://doi.org/10.1049/el:19960840
State	Published - 4 Jul 1996

Keywords

Error statistics
Simulated annealing

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title = "Estimation of the Gilbert model parameters using the simulated annealing method",

abstract = "An estimation method based on the simulated annealing algorithm is proposed for computing the Gilbert model parameters from sample error sequences. Experimental results indicate that the simulated annealing method yields estimates which more closely match the experimental error statistics.",

keywords = "Error statistics, Simulated annealing",

author = "Tan, {T. H.} and Wen-Whei Chang",

year = "1996",

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doi = "10.1049/el:19960840",

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AU - Chang, Wen-Whei

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N2 - An estimation method based on the simulated annealing algorithm is proposed for computing the Gilbert model parameters from sample error sequences. Experimental results indicate that the simulated annealing method yields estimates which more closely match the experimental error statistics.

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KW - Simulated annealing

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EP - 1258

JO - Electronics Letters

JF - Electronics Letters

SN - 0013-5194

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ER -

Estimation of the Gilbert model parameters using the simulated annealing method

Abstract

Keywords

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