Estimating the stiffness parameters of a building by using time series model and Gram-Schmidt process in Morlet wavelet domain

Wei Chih Su, Chiung-Shiann Huang, Ho Cheng Lien

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Identifying the structural modal parameters based on the measured responses of structure is a major application for structural health monitoring. This study presents a procedure based on Gram-Schmidt process to improve the accuracy of the calculated stiffness matrix of a structure. The continuous wavelet transform is applied to the measured responses of a structure and the time series model could be reconstructed to denoise for the measured noisy responses. The identified modal parameters would be obtained from the coefficient in time series model. Next, correcting the identified mode shapes via Gram-Schmidt process. Finally, the structural stiffness matrix can be created via the identified natural frequencies and the corrected mode shapes. The accuracy of this procedure is numerically confirmed; the effects of the wavelet parameters and noise on the ability to accurately estimate the stiffness matrix are also investigated.

Original languageEnglish
Title of host publication2016 International Conference on Applied System Innovation, IEEE ICASI 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467398886
DOIs
StatePublished - 10 Aug 2016
Event2016 International Conference on Applied System Innovation, IEEE ICASI 2016 - Ginowan City Okinawa, Japan
Duration: 28 May 20161 Jun 2016

Publication series

Name2016 International Conference on Applied System Innovation, IEEE ICASI 2016

Conference

Conference2016 International Conference on Applied System Innovation, IEEE ICASI 2016
CountryJapan
CityGinowan City Okinawa
Period28/05/161/06/16

Keywords

  • damage assessment
  • Gram-Schmidt process
  • modal identification
  • Morlet wavelet

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    Su, W. C., Huang, C-S., & Lien, H. C. (2016). Estimating the stiffness parameters of a building by using time series model and Gram-Schmidt process in Morlet wavelet domain. In 2016 International Conference on Applied System Innovation, IEEE ICASI 2016 [7539831] (2016 International Conference on Applied System Innovation, IEEE ICASI 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICASI.2016.7539831