ESPI solution for defect detection in crystalline photovoltaic cells

Ching-Chung Yin*, Tzu Kuei Wen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

The yield of photovoltaic (PV) cells is often reduced by micro-defects in crystalline silicon substrates during fabrication. Common optical inspection for a thin crack in such a large silicon photovoltaic cell is extremely time-consuming and fails in efficiency. This study developed a method of using electronic speckle pattern interferometry (ESPI) for rapidly testing for cracks in an entire field of PV cells. Thermally induced flexural cell deformation was measured by optical configuration for ESPI measurement of out-of-plane deformations. Experimental results indicate that the speckle patterns correlating with thermal deformation of cell enable simultaneous estimation of crack size and location in both single- and poly-crystalline PV cells. This nondestructive detection method has potential applications in PV cell sorting.

Original languageEnglish
Title of host publicationSeventh International Symposium on Precision Engineering Measurements and Instrumentation
DOIs
StatePublished - 1 Dec 2011
Event7th International Symposium on Precision Engineering Measurements and Instrumentation - Lijiang, China
Duration: 7 Aug 201111 Aug 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8321
ISSN (Print)0277-786X

Conference

Conference7th International Symposium on Precision Engineering Measurements and Instrumentation
CountryChina
CityLijiang
Period7/08/1111/08/11

Keywords

  • Defect detection
  • electronic speckle pattern interferometry
  • photovoltaic cell
  • thermal deformation

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