ESD protection design for mixed-voltage I/O circuit with substrate-triggered technique in sub-quarter-micron CMOS process

Ming-Dou Ker, Chien Hui Chuang, Kuo Chun Hsu, Wen Yu Lo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

A substrate-triggered technique is proposed to improve ESD protection efficiency of the stacked-NMOS device in the mixed-voltage I/O circuit. The substrate-triggered technique, can further lower the trigger voltage of the stacked-NMOS device to ensure effective ESD protection for the mixed-voltage I/O circuit. The proposed ESD protection circuit with the substrate-triggered technique for 2.5 V/3.3 V tolerant mixed-voltage I/O circuit has been fabricated and verified in a 0.25-μm salicided CMOS process. Experimental results have confirmed that the HBM ESD robustness of the mixed-voltage I/O circuit can be increased ∼ 65% by this substrate-triggered design.

Original languageEnglish
Title of host publicationProceedings of the 2002 3rd International Symposium on Quality Electronic Design, ISQED 2002
PublisherIEEE Computer Society
Pages331-336
Number of pages6
ISBN (Electronic)0769515614
DOIs
StatePublished - 1 Jan 2002
Event3rd International Symposium on Quality Electronic Design, ISQED 2002 - San Jose, United States
Duration: 18 Mar 200221 Mar 2002

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
Volume2002-January
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Conference

Conference3rd International Symposium on Quality Electronic Design, ISQED 2002
CountryUnited States
CitySan Jose
Period18/03/0221/03/02

Keywords

  • CMOS process
  • CMOS technology
  • Circuits
  • Electrostatic discharge
  • MOS devices
  • MOSFETs
  • Power supplies
  • Protection
  • Robustness
  • Voltage

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  • Cite this

    Ker, M-D., Chuang, C. H., Hsu, K. C., & Lo, W. Y. (2002). ESD protection design for mixed-voltage I/O circuit with substrate-triggered technique in sub-quarter-micron CMOS process. In Proceedings of the 2002 3rd International Symposium on Quality Electronic Design, ISQED 2002 (pp. 331-336). [996768] (Proceedings - International Symposium on Quality Electronic Design, ISQED; Vol. 2002-January). IEEE Computer Society. https://doi.org/10.1109/ISQED.2002.996768