ESD protection design for differential low-noise amplifier with cross-coupled SCR

Chun Yu Lin*, Ming-Dou Ker, Yuan Wen Hsiao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.

Original languageEnglish
Title of host publication2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Pages39-42
Number of pages4
DOIs
StatePublished - 20 Aug 2010
Event2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France
Duration: 2 Jun 20104 Jun 2010

Publication series

Name2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Conference

Conference2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
CountryFrance
CityGrenoble
Period2/06/104/06/10

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