ESD protection design for broadband RF circuits with decreasing-size distributed protection scheme

Ming-Dou Ker*, Bing Jye Kuo

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

5 Scopus citations

Abstract

The resulting capacitive load, from the large electrostatic discharge (ESD) protection device for high ESD robustness, has an adverse effect on the performance of broadband RF circuits due to the impedance mismatch and bandwidth degradation. The conventional distributed ESD protection scheme using equal four-stage ESD protection can achieve a better impedance match, but degrade the ESD performance. A new distributed ESD protection structure is proposed in this work to achieve both good ESD robustness and RF performance. The proposed ESD protection circuit is constructed by arranging ESD protection stages with decreasing device size, named decreasing-size distributed ESD (DS-DESD) protection scheme, which is beneficial to the ESD level. The experimental results had shown the human-body-model (HBM) ESD robustness of up to 8kV.

Original languageEnglish
Pages383-386
Number of pages4
StatePublished - 20 Sep 2004
EventDigest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Fort Worth, TX, United States
Duration: 6 Jun 20048 Jun 2004

Conference

ConferenceDigest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium
CountryUnited States
CityFort Worth, TX
Period6/06/048/06/04

Keywords

  • Broadband RF circuits
  • Coplanar waveguide
  • Distributed ESD (DESD)
  • Electrostatic discharge (ESD)

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