Error-Free Matthiessen's Rule in the MOSFET Universal Mobility Region

Ming-Jer Chen, Wei-Han Lee, Yi-Hui Huang

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

Through the experimentally validated inversion-layer mobility simulation, we devise an error-free version of Matthiessen's rule for a single-gate n-channel bulk MOSFET in the universal mobility region. The core of the new rule lies in a semi-empirical model, which explicitly expresses the errors due to the conventional use of Matthiessen's rule as a function of both the lowest subband population and the relative strength of individual mobility components. The model holds under practical conditions (with temperatures up to 400 K) and in a broad range of substrate doping concentrations (10(14) to 10(18) cm(-3)). To make the error-free proposal more general, we elaborate on several issues, including strain, impurity Coulomb scattering, and remote scattering. The thin-film case can be treated accordingly.
Original languageEnglish
Pages (from-to)753-758
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume60
Issue number2
DOIs
StatePublished - Feb 2013

Keywords

  • Matthiessen's rule; metal-oxide-semiconductor field-effect transistors (MOSFETs); mobility; model; scattering; simulation; strain; universal mobility
  • SILICON INVERSION-LAYERS; SURFACE-ROUGHNESS; ELECTRON-MOBILITY; LIMITED MOBILITY; SOI MOSFETS; FIELD; GATE; TRANSISTORS; EXTRACTION; SIMULATION

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