Erratum: Normalized mutual integral difference operator: A novel experimental method for extracting threshold voltage of MOSFETs (Microelectronics Journal (2002) 33 (667670))

Jin He*, Zhang Xing, Yangyuan Wang, Xuemei Xi, Mansun Chan, Chen-Ming Hu

*Corresponding author for this work

Research output: Contribution to journalComment/debate

Original languageEnglish
Number of pages1
JournalMicroelectronics Journal
Volume41
Issue number10
DOIs
StatePublished - 1 Oct 2010

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