Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon

Wen I. Liang, Chun Yen Peng, Rong Huang, Wei Cheng Kuo, Yen Chin Huang, Carolina Adamo, Yi Chun Chen, Li Chang, Jenh-Yih Juang, Darrel G. Schlom, Ying-hao Chu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.

Original languageEnglish
Pages (from-to)1322-1326
Number of pages5
JournalNanoscale
Volume8
Issue number3
DOIs
StatePublished - 21 Jan 2016

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