Abstract
The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.
Original language | English |
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Pages (from-to) | 1322-1326 |
Number of pages | 5 |
Journal | Nanoscale |
Volume | 8 |
Issue number | 3 |
DOIs | |
State | Published - 21 Jan 2016 |