Enhancement of ferroelectricity in the compositionally graded (Pb,Sr)TiO3 thin films derived by a sol-gel process

Jiwei Zhai*, Xi Yao, Zhengkui Xu, H. D. Chen

*Corresponding author for this work

Research output: Contribution to journalArticle

16 Scopus citations

Abstract

The compositionally graded Pb1-xSr xTiO3 (PST) films with a fine compositional gradient from Pb0.6Sr0.4TiO3 to Pb0.3Sr 0.7TiO3 were fabricated on LNO-buffered Pt/Ti/SiO 2/Si substrates by a sol-gel deposition method. The graded films crystallized into a pure perovskite structure and exhibited highly (1 0 0) preferred orientation after post-deposition annealing. Dielectric and ferroelectric properties were investigated as a function of temperature, frequency and direct current bias field. Dielectric constant peaks, common to a ferroelectric transition, were not observed in the temperature range of 25-250 °C within which the dielectric constant showed weak temperature dependence. This compositionally graded thin film can result in a dielectric constant more than double and a remanent polarization at least two and a half times larger than conventional PST thin films.

Original languageEnglish
Pages (from-to)37-41
Number of pages5
JournalJournal of Crystal Growth
Volume286
Issue number1
DOIs
StatePublished - 1 Jan 2006

Keywords

  • A1. Characterization
  • A3. Polycrystalline deposition
  • B1. Inorganic compounds
  • B2. Ferroelectric materials

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