Electron-electron scattering times in low-diffusivity thick (formula presented) and (formula presented) films

Juhn-Jong Lin, W. Xu, Y. L. Zhong, J. H. Huang, Y. S. Huang

Research output: Contribution to journalArticle

13 Scopus citations

Abstract

We have systematically measured the electron dephasing scattering times from a three-dimensional weak-localization study of low-diffusivity thick (Formula presented) and (Formula presented) films. We find that the inelastic electron scattering rate (Formula presented) varies essentially linearly with the temperature and there is essentially no dependence of (Formula presented) on the electron elastic mean free path. This observation is understood in terms of the current theoretical concept for electron-electron scattering in strongly disordered bulk conductors.

Original languageEnglish
Pages (from-to)344-348
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume59
Issue number1
DOIs
StatePublished - 1 Jan 1999

Fingerprint Dive into the research topics of 'Electron-electron scattering times in low-diffusivity thick (formula presented) and (formula presented) films'. Together they form a unique fingerprint.

  • Cite this