Electron differential inverse mean free path for surface electron spectroscopy

Yung-Fu Chen*, C. M. Kwei

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

70 Scopus citations

Abstract

A new, general expression for the position-dependent differential inverse mean free path (DIMFP) of an electron penetrating into vacuum from a solid is derived. This DIMFP can be divided up into a bulk and a surface term. It is found that the surface effect is restricted to a surface layer extending on both sides of the vacuum-solid interface. An extended Drude dielectric function, which allows the characteristic oscillator strength, damping constant, and critical-point energy for each subband of valence electrons, is employed to estimate electron DIMFPs near Al and Au surfaces. Our results are relevant to the understanding of inelastic electron scattering near a solid surface.

Original languageEnglish
Pages (from-to)131-140
Number of pages10
JournalSurface Science
Volume364
Issue number2
DOIs
StatePublished - 20 Aug 1996

Keywords

  • Electron-solid interactions
  • Photoelectron spectroscopy
  • Scattering

Fingerprint Dive into the research topics of 'Electron differential inverse mean free path for surface electron spectroscopy'. Together they form a unique fingerprint.

Cite this