TY - JOUR
T1 - Electromigration effect on intermetallic growth and Young's modulus in SAC solder joint
AU - Xu, Luhua
AU - Pang, John H.L.
AU - Ren, Fei
AU - Tu, King-Ning
PY - 2006/12/1
Y1 - 2006/12/1
N2 - Solid-state intermetallic compound (IMC) growth behavior plays an important role in solder joint reliability of electronic packaging assemblies. The directional impact of electromigration (EM) on the growth of interfacial IMCs in Ni/ SAC/Ni, Cu/SAC/Ni single BGA ball solder joint, and fine pitch ball-grid-array (FPBGA) at the anode and cathode sides is reported in this study. When the solder joint was subjected to a current density of 5,000 A/cm 2 at 125°C or 150°C, IMC layer growth on the anode interface was faster than that on the cathode interface, and both were faster than isothermal aging due to the Joule heating effect. The EM affects the IMC growth rate, as well as the composition and mechanical properties. The Young's modulus and hardness were measured by the nanoindentation continuous stiffness measurement (CSM) from planar IMC surfaces after EM exposure. Different values were observed at the anode and cathode. The energy-dispersive x-ray (EDX) line scan analysis was conducted at the interface from the cathode to anode to study the presence of species; Ni was found in the anode IMC at SAC/Cu in the Ni/SAC/Cu joint, but not detected when the current was reverse. Electron-probe microanalysis (EPMA) measurement on the Ni/SAC/Ni specimen also confirmed the polarized Ni and Cu distributions in cathode and anode IMCs, which were (Ni 0.57Cu 0.43) 3Sn 4 and (Cu 0.73Ni 0.27) 6Sn 5, respectively. Thus, the Young's moduli of the IMC are 141 and 175 GPa, respectively.
AB - Solid-state intermetallic compound (IMC) growth behavior plays an important role in solder joint reliability of electronic packaging assemblies. The directional impact of electromigration (EM) on the growth of interfacial IMCs in Ni/ SAC/Ni, Cu/SAC/Ni single BGA ball solder joint, and fine pitch ball-grid-array (FPBGA) at the anode and cathode sides is reported in this study. When the solder joint was subjected to a current density of 5,000 A/cm 2 at 125°C or 150°C, IMC layer growth on the anode interface was faster than that on the cathode interface, and both were faster than isothermal aging due to the Joule heating effect. The EM affects the IMC growth rate, as well as the composition and mechanical properties. The Young's modulus and hardness were measured by the nanoindentation continuous stiffness measurement (CSM) from planar IMC surfaces after EM exposure. Different values were observed at the anode and cathode. The energy-dispersive x-ray (EDX) line scan analysis was conducted at the interface from the cathode to anode to study the presence of species; Ni was found in the anode IMC at SAC/Cu in the Ni/SAC/Cu joint, but not detected when the current was reverse. Electron-probe microanalysis (EPMA) measurement on the Ni/SAC/Ni specimen also confirmed the polarized Ni and Cu distributions in cathode and anode IMCs, which were (Ni 0.57Cu 0.43) 3Sn 4 and (Cu 0.73Ni 0.27) 6Sn 5, respectively. Thus, the Young's moduli of the IMC are 141 and 175 GPa, respectively.
KW - Electromigration
KW - Intermetallic compound
KW - Lead-free SnAgCu solder
KW - Nanoindentation
UR - http://www.scopus.com/inward/record.url?scp=33846411442&partnerID=8YFLogxK
U2 - 10.1007/s11664-006-0321-8
DO - 10.1007/s11664-006-0321-8
M3 - Article
AN - SCOPUS:33846411442
VL - 35
SP - 2116
EP - 2125
JO - Journal of Electronic Materials
JF - Journal of Electronic Materials
SN - 0361-5235
IS - 12
ER -