Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels

Yao Chin Wang; Bor-Shyh Lin; Ming-Che Chan

doi:10.1016/j.measurement.2015.03.018

Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels

Yao Chin Wang^*, Bor-Shyh Lin, Ming-Che Chan

^*Corresponding author for this work

Research output: Contribution to journal › Article

2 Scopus citations

Abstract

The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.

Original language	English
Pages (from-to)	83-87
Number of pages	5
Journal	Measurement: Journal of the International Measurement Confederation
Volume	70
DOIs	https://doi.org/10.1016/j.measurement.2015.03.018
State	Published - 11 Apr 2015

Keywords

Electro-optical measurement
Integrated gate driver
TFT array panel

Access to Document

10.1016/j.measurement.2015.03.018

Link to publication in Scopus

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Wang, Y. C., Lin, B-S., & Chan, M-C. (2015). Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels. Measurement: Journal of the International Measurement Confederation, 70, 83-87. https://doi.org/10.1016/j.measurement.2015.03.018

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abstract = "The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.",

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AU - Chan, Ming-Che

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AB - The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.

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