Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels

Yao Chin Wang*, Bor-Shyh Lin, Ming-Che Chan

*Corresponding author for this work

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.

Original languageEnglish
Pages (from-to)83-87
Number of pages5
JournalMeasurement: Journal of the International Measurement Confederation
Volume70
DOIs
StatePublished - 11 Apr 2015

Keywords

  • Electro-optical measurement
  • Integrated gate driver
  • TFT array panel

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