TY - JOUR
T1 - Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels
AU - Wang, Yao Chin
AU - Lin, Bor-Shyh
AU - Chan, Ming-Che
PY - 2015/4/11
Y1 - 2015/4/11
N2 - The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.
AB - The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance.
KW - Electro-optical measurement
KW - Integrated gate driver
KW - TFT array panel
UR - http://www.scopus.com/inward/record.url?scp=84953885428&partnerID=8YFLogxK
U2 - 10.1016/j.measurement.2015.03.018
DO - 10.1016/j.measurement.2015.03.018
M3 - Article
AN - SCOPUS:84953885428
VL - 70
SP - 83
EP - 87
JO - Measurement: Journal of the International Measurement Confederation
JF - Measurement: Journal of the International Measurement Confederation
SN - 0263-2241
ER -