Electrical degradation of n-channel poly-Si TFT under AC stress

C. W. Chen*, T. C. Chang, Po-Tsun Liu, H. Y. Lu, T. M. Tsai, C. F. Weng, C. W. Hu, Tseung-Yuen Tseng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Fingerprint Dive into the research topics of 'Electrical degradation of n-channel poly-Si TFT under AC stress'. Together they form a unique fingerprint.

Physics & Astronomy

Chemical Compounds

Engineering & Materials Science