Electrical characterization of La2O3-gated metal oxide semiconductor field effect transistor with mg incorporation

Tomotsune Koyanagi*, Kiichi Tachi, Kouichi Okamoto, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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