Abstract
Electric fatigue in Pb(Nb,Zr,Sn,Ti)O3 thin films grown by sol-gel process was investigated. Films were grown on LaNiO 3-buffered Pt/Ti/SiO2/Si substrates. It was found that with an increase in cycling field, the remanent polarization increased. Fatigue properties of the films were closely related to the nonuniform strain buildup due to switching.
| Original language | English |
|---|---|
| Pages (from-to) | 978-980 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 83 |
| Issue number | 5 |
| DOIs | |
| State | Published - 4 Aug 2003 |
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Zhai, J., & Chen, H. D. (2003). Electric fatigue in Pb(Nb,Zr,Sn,Ti)O3 thin films grown by a sol-gel process. Applied Physics Letters, 83(5), 978-980. https://doi.org/10.1063/1.1594843