Electric fatigue in Pb(Nb,Zr,Sn,Ti)O3 thin films grown by a sol-gel process

Jiwei Zhai, H. D. Chen*

*Corresponding author for this work

Research output: Contribution to journalArticle

27 Scopus citations

Abstract

Electric fatigue in Pb(Nb,Zr,Sn,Ti)O3 thin films grown by sol-gel process was investigated. Films were grown on LaNiO 3-buffered Pt/Ti/SiO2/Si substrates. It was found that with an increase in cycling field, the remanent polarization increased. Fatigue properties of the films were closely related to the nonuniform strain buildup due to switching.

Original languageEnglish
Pages (from-to)978-980
Number of pages3
JournalApplied Physics Letters
Volume83
Issue number5
DOIs
StatePublished - 4 Aug 2003

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