Abstract
Electric fatigue in Pb(Nb,Zr,Sn,Ti)O3 thin films grown by sol-gel process was investigated. Films were grown on LaNiO 3-buffered Pt/Ti/SiO2/Si substrates. It was found that with an increase in cycling field, the remanent polarization increased. Fatigue properties of the films were closely related to the nonuniform strain buildup due to switching.
Original language | English |
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Pages (from-to) | 978-980 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 5 |
DOIs | |
State | Published - 4 Aug 2003 |