Effects of minority-carrier response behavior on Ge MOS capacitor characteristics: Experimental measurements and theoretical simulations

Chao Ching Cheng*, Chao-Hsin Chien, Guang Li Luo, Yu Ting Ling, Ruey Dar Chang, Chi Kei Kei, Chien Nan Hsiao, Jun Cheng Liu, Chun Yen Chang

*Corresponding author for this work

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Chemical Compounds

Engineering & Materials Science